Microscopy, Atomic Force

A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

Year introduced: 1995

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Tree Number(s): E01.370.350.515.666.400, E05.595.666.400

MeSH Unique ID: D018625

Entry Terms:

• Atomic Force Microscopy
• Atomic Force Microscopies
• Microscopies, Atomic Force
• Scanning Force Microscopy
• Force Microscopies, Scanning
• Force Microscopy, Scanning
• Microscopies, Scanning Force
• Microscopy, Scanning Force
• Scanning Force Microscopies
• Force Microscopy
• Force Microscopies
• Microscopies, Force
• Microscopy, Force

Previous Indexing:

• Microscopy (1988-1994)
• Microscopy, Scanning Tunneling (1988-1994)

See Also:

• Microscopy, Scanning Tunneling

All MeSH Categories
Analytical, Diagnostic and Therapeutic Techniques and Equipment Category
Diagnosis
Diagnostic Techniques and Procedures
Diagnostic Imaging
Microscopy
Microscopy, Scanning Probe
Microscopy, Atomic Force

All MeSH Categories
Analytical, Diagnostic and Therapeutic Techniques and Equipment Category
Investigative Techniques
Microscopy
Microscopy, Scanning Probe
Microscopy, Atomic Force